Title: Introduction to Automatic Test Systems
Instructors:
Dr. David R. Carey, TEVET
Michael Seavey, Northrop Grumman (Retired)
Monday, August 28, 2023, 8:00 am – 12:00 noon
Description: In this tutorial, the design process for Automated Test Systems is presented using standard systems engineering principles. No prior knowledge of ATE, ATS, or TPS development is assumed. A general familiarity with electronic testing techniques is a prerequisite for a full understanding of the material presented. This class will present a series of reference designs as a starting point for ATS and TPS development. Proposed design stages are explained in view of the typical division between hardware and software for the ATS. The process, in which design recommendations are made, can make the development of future systems easier. Thus, central in this tutorial is helping design teams to consider important aspects in decisions taken along the development process and keeping these decisions linked to the test requirements defined in initial development stages.
Title: Digital Thread
Instructors:
Eric Gould, DSI International
Dr. Ion Neag, Reston Software
Monday, August 28, 2023, 8:00 am – 12:00 noon
Description: In this tutorial, we will discuss the use of a digital thread to integrate activities performed during design engineering, diagnostic engineering, test engineering and run-time diagnostics & maintenance. We will first discuss what makes a given format a good candidate for use in a digital thread—in particular if that thread is intended to constitute the authoritative source of truth for a given project or enterprise. We will then take a deep dive into a representative standards-based digital thread, examining MBSE representations of a design in SysML, XML-based models used during diagnostic engineering, and individual formats in the ATML “family” of standards (IEEE 1671, 1641 & 1636). Although no prior knowledge of these formats (or the activities they integrate) is necessary, a general knowledge of test and/or diagnostic development would be helpful. Participants should leave this tutorial with an understanding of how a digital thread can be used to eliminate redundant efforts, ensure data consistency, collapse engineering timelines, provide closed-loop feedback for design/test/diagnostic optimization (to reduce false alarms, NFFs, RTOKs, etc.) and produce a low-overhead enduring, authoritative source of truth for a given project or enterprise.
Title: ATS and TPS Management
Instructors:
Tony Conard, US Navy; Richard Foyt, US Marine Corps
Scott Kautzmann, US Army
Larry Adams, US Air Force
Monday, August 28, 2023, 1:00 pm – 5:00 pm
Description: This four-part Tutorial is designed to cover policy and challenges in acquiring and managing Automatic Test Equipment (ATE); Automatic Test Systems (ATS) and Test Program Sets (TPSs). This session is a must for industry and government ATE/TPS managers from entry level to experienced desiring to gain significant insights in management and acquiring ATS/TPS across the services. From this session you will gain essential insights into real world situations to include exploration of areas of frequent problems. Organizational, process/method differences between services will be highlighted. Four major topics are covered, including: 1) TPS Acquisition & Management Processes and Challenges (Navy), 2) Management of ATS and TPS for Weapon System Support (Army), 3) ATS Management in a Dynamic Environment (USMC), and 4) AF Perspectives on ATS Management.
Title: Diagnostics and Design for Built-In Test
Instructors
Dr. John W. Sheppard, Montana State University
Dr. David R. Carey, TEVET
Monday, August 28, 2023, 1:00 pm – 5:00 pm
Description: With advancing technology and increasingly complex electronic systems, almost every test approach has had to settle for lower fault coverage, more challenges in making diagnoses, and increased cost in developing test and diagnosis solutions. Today’s production and maintenance test engineers need to get involved with embedded test, diagnostics, and Design for Testability (DFT) enabled designs while utilizing advanced methodologies to keep pace with the growth in complexity; however, the details of how best to utilize these test methodologies often remain a mystery. This tutorial provides a comprehensive overview of the Built-In-Test & Diagnostics challenges and solutions. The Design for Built-In Test section of the tutorial introduces terminology and concepts. Various implementation issues are addressed as the tutorial moves through test strategies, circuit implementation, and test methodologies. The diagnostics section of this tutorial provides an overview of traditional and recent approaches to system-level diagnosis and prognosis. The emphasis is placed on different system modeling approaches and the algorithms that can be applied using resulting models.
Title: Cybersecurity for ATS
Instructor:
James Orlet, The Boeing Company
Monday, August 28, 2023, 1:00 pm – 5:00 pm
Description: This tutorial session covers the definitions and relationships between various cybersecurity guidelines as they concern test and test equipment. The first section will discuss cybersecurity terminology and definitions. The second will focus on the relationships between the various steps of the National Institute of Standards and Technology (NIST) Risk Management Framework (RMF) used by many programs to guide cybersecurity approach and includes a discussion other the NIST Special Publication 800-series General Information items that affect Automatic Test Systems (ATS). The final section provides an initial set of best practices for Cybersecurity on ATS and an introduction to the Cybersecurity Maturity Model Certification (CMMC) efforts.